CAIK is a part of KFRI which is an institution of KSCSTE.
CAIK Analytical Services
Analytical Services
by Sophisticated Instrumental methods.
CAIK Analytical Charges
Analytical Charges
Instrument wise charges and mode of payment..

X-Ray Diffractometer (XRD)

Make: Rigaku Corporation, Japan.
Model: Miniflex 6G

CAI-K X-Ray Diffractometer (XRD)

XRD is used for determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.


  • Thin-film analysis.
  • Lattice parameter determination
  • Purity/quality control of materials.
  • Determination of crystallinity of polycrystalline Materials etc.


    Vertical type with θ-2θ geometry
    Scanning range: -30 to 1450 (2θ)
    Scanning speed: 0.01 to100 degree/ minute
    Detector: High speed High resolution solid state based detector
    Software: Smart Lab Studio-II


  • If physical treatment of sample like milling, grinding is required then proper care should be taken.
  • The optimal particle size of powder diffraction samples is in the range of 1 to 5 m.
  • Powder samples: Sample should be finely powdered and the quantity should be at least 500 mg.
  • Samples coated on glass: The sample should be coated on one end of the glass slide uniformly.
  • Coating should be uniform and thin (?50 m).

Sample Requirement

2-5g of Dry Sieved powder

Instrument Status


Analytical Charges

Facility/ Equipment Rates for sample analysis (Rs) Service tax -18 % extra)
KSCSTE Labs Edu. Insti. Govt R&D Labs Industries
Powder XRD 260.00 520.00 1040.00 1560.00