XRD is used for determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.

Applications

• Thin-film analysis.
• Lattice parameter determination
• Purity/quality control of materials.
• Determination of crystallinity of polycrystalline Materials etc.

Specifications

Vertical type with θ-2θ geometry
Scanning range: -30 to 1450 (2θ)
Scanning speed: 0.01 to100 degree/ minute
Detector: High speed High resolution solid state based detector
Software: Smart Lab Studio-II

Instructions

• If physical treatment of sample like milling, grinding is required then proper care should be taken.
• The optimal particle size of powder diffraction samples is in the range of 1 to 5 µm.
• Powder samples: Sample should be finely powdered and the quantity should be at least 500 mg.
• Samples coated on glass: The sample should be coated on one end of the glass slide uniformly.
• Coating should be uniform and thin (?50 µm).

Sample Requirement

2-5g of Dry Sieved powder

Instrument Status

Working

Analytical Charges